Bruker : Introduces eWARP, a Pioneering New EBSD Detector for Advanced Materials Characterization in Scanning Electron Microscopes

BRKR
September 20, 2025
Bruker announced the launch of eWARP, a new detector for Electron Backscatter Diffraction (EBSD), on March 26, 2025. This groundbreaking technology features a Bruker-engineered camera that combines direct electron detection and CMOS technologies. The eWARP detector is designed to be the fastest and most signal-efficient EBSD detector, significantly pushing the limits for materials characterization in Scanning Electron Microscopes (SEM). It enables the acquisition of EBSD maps at up to 14,400 patterns per second. At its core, eWARP utilizes a patented CMOS device with on-sensor binning capability, allowing for Forescatter Electron (FSE) and Backscatter Electron (BSE) imaging at up to 350,000 patterns per second. This performance leap offers new analytical opportunities for challenging applications requiring high spatial resolution and low electron energy. The content on BeyondSPX is for informational purposes only and should not be construed as financial or investment advice. We are not financial advisors. Consult with a qualified professional before making any investment decisions. Any actions you take based on information from this site are solely at your own risk.